I-V Characteristics of Thin Film Pt/BaxSr1-xTiO3/Pt Structures under the Impact of Electron Beam Irradiation

V. V. Buniatyan; V. M. Tsakanov; G. S. Karoyan; H. R. Dashtoyan

V. V. Buniatyan National Polytechnic University of Armenia
V. M. Tsakanov National Polytechnic University of Armenia
G. S. Karoyan National Polytechnic University of Armenia
H. R. Dashtoyan National Polytechnic University of Armenia

Keywords: leakage current, ferroelectric, trapping center, Schottky barrier, Poole-Frenkel emission, oxygen vacancy.

Abstract

А detailed theoretical study of the leakage currents in ferroelectric Pt/BaxSt1-xTiO3/Pt (Pt/BSTO/Pt) thin film structures is presented, when the film is irradiated by an electron beam. It is shown, that both the Schottky barrier thermal/field assisted emission and Poole-Frenkel (FP) emission from the oxygen vacancy conditioned electron traps may take place simultaneously if the absorbed energy of electron’s from the electron beam is higher than its activation energy to release to the conduction band of the ferroelectric.

Author Biographies

V. V. Buniatyan, National Polytechnic University of Armenia

Buniatyan Vahe Vazgen
Doctor of tech.sci., Prof. of the Chair “Microelectronics and Bio-medical Devices”

V. M. Tsakanov, National Polytechnic University of Armenia

Tsakanov Vasiliy Mkrtich
Doctor of Phys.-Math. sci., Head of the Fund of Organization “Candle” Synchrotron Research

G. S. Karoyan, National Polytechnic University of Armenia

Karoyan Gegham Sargis
Candidate of tech. sci., Associate Prof. of the Chair “Electronics”

H. R. Dashtoyan, National Polytechnic University of Armenia

Dashtoyan Hovhannes Robert
Post-graduate student of the Chair “Microelectronics and Biomedical Devices”