X-RAY INTERFEROMETRIC METHOD FOR DETERMINING THE REFRACTIVE INDICES OF SOME SOLID BODIES AND LIQUIDS

MATERIAL SCIENCE

  • A. H. Aboyan National Polytechnic University of Armenia
  • S. G. Aghbalyan National Polytechnic University of Armenia
Keywords: silicon single crystal, interferometer, moiré pattern, single decrement, total reflection, different angle wedges.

Abstract

The refractive indices of some solid bodies have been determined by means of X-ray interferometric method for various characteristic radiations of the X-ray range. The refractive index was shown to decrease, i.e., the single decrement to increase, as the wavelength of Xrays (normal dispersion) increased. The dependencies of single decrements of the refractive index on the wavelength were established to be almost identical for all substances,- the single decrement being increased nonlinearly with increasing the wavelength. A new X-ray interferometric method for determining the refractive index of liquids is proposed. The single decrement of the refractive index of the solution was established to decrease, i.e., the refractive index to increase, as the concentration of ethyl alcohol in water increased.

Author Biographies

A. H. Aboyan, National Polytechnic University of Armenia

Абоян Арсен Оганесович - д.ф.-м.н., профессор, кафедра Физики, НПУА

S. G. Aghbalyan, National Polytechnic University of Armenia

Агбалян Сурен Геворкович - д.т.н., профессор, кафедра Металлургии и материаловедения, НПУА

Published
2016-12-16
Issue
Vol 19 No 2 (2016): 2 (19) / 2016
Section
Articles